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V 93000 alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Teradyne
ETS 364
Test & Probe
The Teradyne / Eagle ETS 364 Tester is a semiconductor test system with configurable analog and digital pin units.
Teradyne
iFlex
Test & Probe
The Teradyne iFlex Tester is a configurable test platform with power ratings up to 28.8 kVA at 480 VAC and can be equipped with modules including HSD200, DC30, DC75, BBAC, and VHFAC.
Teradyne
J 750
Test & Probe
Teradyne J 750 is a semiconductor test and probe system used for electrical evaluation of devices during manufacturing. It belongs to the class of automated test equipment that supports wafer or device-level screening before final assembly.
Teradyne
Ultra Flex SC
Test & Probe
The Teradyne Ultra Flex SC is a semiconductor test system used for test and probe applications.
Applied Materials
0720 06060 Part
Test & Probe
KLA
1007
Test & Probe
The KLA 1007 is a wafer prober manufactured by KLA.
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