Comparison ledger
Advantest T5335P Automated, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T5335P AutomatedAdvantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T5335P Automated | KLA 1007 |
| Specifications | ||
| 1'ST DPU | STN 1,2 [Y,N] ..........................> YES[1] | — |
| 2'ND DPU | STN 1,2 [Y,N] ..........................> NO[1] | — |
| Voltage | 10V PPS CONFIGURATION [1-32] .............> 1-32[1] | — |
| TYPE OF CBU BOARD [1,2] (1 | BGR-019267 )[1] | — |
| (2 | BGR-019267X02) ....> 1[1] | — |
| Attachments | 1 Files[1] | — |
| Manufacturer | — | KLA[2] |
| Model | — | 1007[2] |
| Description | — | Wafer Prober[2] |
| Wafer size | — | 150 mm[2] |
| Convertible to 8 inch wafer size | — | Yes[2] |
| Vintage | — | 01.06.1995[2] |
| Make | — | KLA[3] |
| Equipment type | — | Prober[3] |
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